 | |
 |
|
|
|
|
|
| |
| |
| |
|
|
| |
| |
Wicked (Analysis Suite)
Wicked NOD enables the user to perform powerful analyses based on typical (nominal) process characteristics. The designer gets insight into dependencies between performances and parameters with very small simulation effort.
With WCA the circuit designer is able to estimate the worst-case conditions for individual performance specifications. It determines partial and total yields for given specifications on circuit performances.
WCD enables the designers to interactively improve and optimize the robustness for their designs. MunEDA's unique silicon proven Worst Case Distance methodology also enables the interactive optimization for yield.
Wicked (Optimization Suite)
FEA Feasibility enables the circuit designer to automatically optimize the operating point of its design to fulfil all electrical/geometrical constraints. A feasible design represents a first step towards successful circuit optimization.
DNO is a powerful optimization engine for automatic nominal circuit optimization. DNO improves circuit performance values by changing design parameters with unique gradient-based optimization algorithms.
YOP is one of the most powerful tools for automatic performance and yield optimization based on global and local process parameter variations. Active optimization of 6 sigma robustness levels and more are now possible.
Wicked (Verification Suite)
MMA Identifies and analyses mismatch-relevant transistor pairs on selected circuit performances. The variance of these local variations will be analyzed based on dependencies of device pair geometries.
MCA is one of the most powerful Monte Carlo Analysis tools on the market. Containing numerous tools and features for parametric yield analysis, contributors for yield loss can be detected and eliminated.